AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) Layers
| Authors | M. Benhaliliba1 , A. Tiburcio-Silver2, A. Avila-Garcia3 |
| Affiliations | 1 Department of Material Technology, Physics Faculty, USTOMB University, BP1505 Oran, Algeria 2 ITT-DIE, Apdo, Postal 20, Metepec 3, 52176 Estado de Mexico, Mexico 3 Cinvestav-IPN, Dept. Ingeniería Eléctrica-SEES, Apdo. Postal 14-740, 07000 México, D.F., Mexico |
| Е-mail | mbenhaliliba@gmail.com |
| Issue | Volume 7, Year 2015, Number 4 |
| Dates | Received 17 August 2015; published online 10 December 2015 |
| Citation | M. Benhaliliba, A. Tiburcio-Silver, A. Avila-Garcia, J. Nano- Electron. Phys. 7 No 4, 04012 (2015) |
| DOI | |
| PACS Number(s) | 68.37.Ps, 68.35.Ct, 81.05.Cy |
| Keywords | Spin coating (5) , ZnO layer, Metallic dopant, Atomic force microscope, Grain size (4) , Roughness (3) , Histogram. |
| Annotation | This paper reports on the deposition and surface properties of the pure and doped zinc oxide layers produced by spin coating route. Pure and metallic (Al, Sn, Cd, Co) doped ZnO films are characterized by mean of atomic force microscopy (AFM). Based on atomic force microscope observation, some parameters such as grain size, height, orientation of angle and histogram are determined. The AFM scanned 2D and 3D-views permit us to discover the roughness, the average height and the skewness of clusters or grains. |
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List of References |
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