Authors | S. Ghahramani, H. Kangarlau |
Affiliations | Faculty of science, Urmia branch, Islamic Azad University, Urmia, Iran |
Е-mail | Soghra.Ghahramani@gmail.com, hkangarloo@yahoo.com |
Issue | Volume 5, Year 2013, Number 4 |
Dates | Received 09 June 2013; revised manuscript received 08 July 2013; published online 31 January 2014 |
Citation | S. Ghahramani, H. Kangarlau, J. Nano- Electron. Phys. 5 No 4, 04051 (2013) |
DOI | |
PACS Number(s) | 78.20.Ci, 78.67.Pt |
Keywords | Multilayer semiconductors, Magnesium fluoride, Titanium dioxide (4) , Kramers-Kronig. |
Annotation | MgF2 thin films by thickness of 93 nm were deposited on MgF2 / glass and TiO2 / glass thin layers by resistance evaporation method under ultra-high vacuum (UHV) conditions, rotating pre layer for sample one and normal deposition for second one. Optical properties were measured via spectrophotometer in spectral range of 300-1100 nm wave length. The optical constants such as, real part of refractive index (n), imaginary part of refractive index (k), real and imaginary parts of dielectric function ε1, ε2 respectively and absorption coefficient (), were obtained from Kramers-Kronig analysis of reflectivity curves. Band-gap energy was also estimated for these films. |
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