Authors | A.P. Kuzmenko1 , P.V. Abakumov1, L.I. Roslyakova1, M.B. Dobromyslov2 |
Affiliations | 1 Southwest State University, 94, 50 Let Oktyabrya Str., 305040 Kursk, Russia 2 Pacific National University, 136, Tihookeanskaya Str., 680035 Khabarovsk, Russia |
Е-mail | |
Issue | Volume 5, Year 2013, Number 4 |
Dates | Received 24.10.2013, published online - 10.12.2013 |
Citation | A.P. Kuzmenko, P.V. Abakumov, L.I. Roslyakova, M.B. Dobromyslov, J. Nano- Electron. Phys. 5 No 4, 04039 (2013) |
DOI | |
PACS Number(s) | 42.65.Dr, 75.60.Ch |
Keywords | Domain structure (3) , Scanning probe microscopy types of domain walls. |
Annotation | By using atomic force microscopy (resolution of 40 nm) the effect of surface roughness and internal inhomogeneities on the fine structure of domain walls of different types in thin transparent orthoferrite samples cut perpendicular to the optic axis for YFeO3 and axis [001] for DyFeO3 has been studied. |
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