Authors | S. Emelyanov1, A. Kuzmenko1 , V. Rodionov1 , M. Dobromyslov2 |
Affiliations | 1 Southwest State University, 94, 50 Let Oktyabrya Str., 305040 Kursk, Russia 2 Pacific National University, 136, Tihookeanskaya Str., 680035 Khabarovsk, Russia |
Е-mail | |
Issue | Volume 5, Year 2013, Number 4 |
Dates | Received 24 October 2013; published online 10 December 2013 |
Citation | S. Emelyanov, A. Kuzmenko, V. Rodionov, M. Dobromyslov, J. Nano- Electron. Phys. 5 No 4, 04023 (2013) |
DOI | |
PACS Number(s) | 07.78. + s, 07.85.Fv, 42.65.Dr, 07.57. – c |
Keywords | Scanning electron microscopy (16) , X-ray diffraction (19) , Small-angle X-ray scattering (6) , Raman scattering spectroscopy (2) , Mapping of Raman shift distributions (2) , Microwave absorption, Shungite. |
Annotation | According to SEM, X-ray phase analysis, Raman scattering data features of nanostructural changes in shungite carbon structure were found when processing shungite in 52 % hydrofluoric acid. It is found that conductivity increases up to the values of electrical graphite and absorption of microwave radiation also increases at frequencies up to 40 GHz, which, along with dielectric losses, is due to intense processes of both scattering at laminar carbon structures and absorption of electromagnetic energy. |
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