Structure and Magnetoresistive Properties of Thee-layer Film Systems Based on Permalloy and Copper

Authors Yu.O. Shkurdoda1 , А.М. Chornous1, V.B. Loboda1 , Yu.М. Shabelnyk1, V.О. Kravchenko2, L.V. Dekhtyaruk3 ,
Affiliations

1 Sumy State University, 2, Rymskogo-Korsakova St., 40007 Sumy, Ukraine

2 Sumy State Pedagogical University named after A.S. Makarenka, 87, Romenska St., 40002 Sumy, Ukraine

3 Kharkiv National University of Construction and Architecture, 40, Sumska St., 61002 Kharkiv, Ukraine

Е-mail [email protected]
Issue Volume 8, Year 2016, Number 2
Dates Received 21 February 2016; revised manuscript received 14 May 2016; published online 21 June 2016
Citation Yu.O. Shkurdoda, А.М. Chornous, V.B. Loboda, et al., J. Nano- Electron. Phys. 8 No 2, 02056 (2016)
DOI 10.21272/jnep.8(2).02056
PACS Number(s) 61.05.J –, 61.72. – y, 81.40.Gh
Keywords Multilayer film system, Crystal structure (8) , Phase composition (3) , Anisotropic magnetoresistance, Spin-dependent scattering of electrons.
Annotation

Structural and phase composition and magnetoresistive properties of three-layer film systems based on permalloy and copper were investigated. The samples were obtained by layer by layer condensation method with followed heat treatment to the 300-700 K temperature range. Shown that the spin-dependent scattering of electrons realizing in the range of layer thicknesses (dCu = 6-15 nm and dPy = 25-40 nm) of the condensed and annealed at 400 K samples. The Maximum GMR observed after annealing the samples at 400 K and annealing to 550 K leads to anisotropic magnetoresistance occurrence.

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