Structure and Magnetoresistive Properties of Thee-layer Film Systems Based on Permalloy and Copper
| Authors | Yu.O. Shkurdoda1 , А.М. Chornous1, V.B. Loboda1 , Yu.М. Shabelnyk1, V.О. Kravchenko2, L.V. Dekhtyaruk3 , |
| Affiliations |
1 Sumy State University, 2, Rymskogo-Korsakova St., 40007 Sumy, Ukraine 2 Sumy State Pedagogical University named after A.S. Makarenka, 87, Romenska St., 40002 Sumy, Ukraine 3 Kharkiv National University of Construction and Architecture, 40, Sumska St., 61002 Kharkiv, Ukraine |
| Е-mail | kabmet@ukr.net |
| Issue | Volume 8, Year 2016, Number 2 |
| Dates | Received 21 February 2016; revised manuscript received 14 May 2016; published online 21 June 2016 |
| Citation | Yu.O. Shkurdoda, А.М. Chornous, V.B. Loboda, et al., J. Nano- Electron. Phys. 8 No 2, 02056 (2016) |
| DOI | 10.21272/jnep.8(2).02056 |
| PACS Number(s) | 61.05.J –, 61.72. – y, 81.40.Gh |
| Keywords | Multilayer film system, Crystal structure (8) , Phase composition (3) , Anisotropic magnetoresistance, Spin-dependent scattering of electrons. |
| Annotation |
Structural and phase composition and magnetoresistive properties of three-layer film systems based on permalloy and copper were investigated. The samples were obtained by layer by layer condensation method with followed heat treatment to the 300-700 K temperature range. Shown that the spin-dependent scattering of electrons realizing in the range of layer thicknesses (dCu = 6-15 nm and dPy = 25-40 nm) of the condensed and annealed at 400 K samples. The Maximum GMR observed after annealing the samples at 400 K and annealing to 550 K leads to anisotropic magnetoresistance occurrence. |
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List of References |
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