The Mechanism of Voltage Oscillations in a Siliceous Structure with the Occurrence of Extreme Currents

Authors S.P. Pavlyuk , V.I. Grygoruk , V.M. Telega , M.V. Petrychuk, A.V. Ivanchuk
Affiliations

Taras Shevchenko National University of Kyiv, 4g GlushkovAve., 03022 Kyiv, Ukraine

Е-mail [email protected]
Issue Volume 10, Year 2018, Number 4
Dates Received 10 April 2018; published online 25 August 2018
Citation S.P. Pavlyuk, V.I. Grygoruk, V.M. Telega, et al., J. Nano- Electron. Phys. 10 № 4, 04010 (2018)
DOI https://doi.org/10.21272/jnep.10(4).04010
PACS Number(s) 73.40.Ty, 00.00.Хх
Keywords SSDI structure, Extreme current, Voltage oscillations.
Annotation

In the work, studies of voltage oscillations that occur during the flow of high-density currents through a silicon structure with dielectric insulation (SSDI structure) are carried out. Volt-ampere characteristics of the structure in the pulsed mode, characteristic parameters of the oscillograms of oscillations, both relaxation and quasi-harmonic, were studied. A model of the occurrence of oscillations is proposed.

List of References

English version of article