Authors | J.A. Suchikova |
Affiliations | Berdyansk State Pedagogical University, 4, Schmidt Str., 71106 Berdyansk, Ukraine |
Е-mail | |
Issue | Volume 7, Year 2015, Number 3 |
Dates | Received 02 May 2015; published online 20 October 2015 |
Citation | J.A. Suchikova, J. Nano- Electron. Phys. 7 No 3, 03017 (2015) |
DOI | |
PACS Number(s) | 61.43Gt, 78.30Fs, 78.55m |
Keywords | Indium nitride, Porous indium phosphide, Buffer layer epitaxy, Electrochemical etching, Lattice constant (2) . |
Annotation | The paper presents a technique to obtain InN films on porous InP substrates by radical-beam gettering epitaxy. According to the results of the Auger spectroscopy, InN film thickness ranged from 100 nm to 0.5 microns depending on the etching conditions. |
List of References English version of article |