Definition of the Complex Refractive Index of an Etalon for Measuring the Reflection Coefficient
| Authors | V.I. Shkaleto, G.I. Kopach , R.V. Zaitsev |
| Affiliations | National technical University “Kharkov Polytechnic Institute”, 21, Frunze Str., 61002 Kharkov, Ukraine |
| Е-mail | |
| Issue | Volume 6, Year 2014, Number 2 |
| Dates | Received 09 February 2014; published online 20 June 2014 |
| Citation | V.I. Shkaleto, G.I. Kopach, R.V. Zaitsev, J. Nano- Electron. Phys. 6 No 2, 02013 (2014) |
| DOI | |
| PACS Number(s) | 78.20.Ci, 42.79.Fm |
| Keywords | Complex refractive index, Spectrophotometer (2) , Inverse problem of optics. |
| Annotation | The paper describes methods for determination of the complex refractive index of opaque objects by the measurement results of the reflection coefficients at two different angles of incidence. Optical schemes of attachments to the spectrophotometer SF-46 for measuring the reflection coefficient by absolute and relative methods are represented. The choice of the material of etalon for measurements of the reflection by relative method is validated. The algorithm of the program “Back Task Optic” to determine the complex refractive index by the results of optical measurements is given. The measurement results of the light-transmission coefficients through attachments to define the parameters of etalon mirrors and its refractive index are presented. |
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List of References English version of article |
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