Response of Ag Thick Film Microstripline due to Superstrate Strontium Substituted Bismuth Manganites
| Authors | S.N. Mathad1 , R.N. Jadhav2, Varsha Phadatare2, Vijaya Puri2 |
| Affiliations | 1 K.L.E Institute of Technology, Hubli, India 2 Thick and thin film device lab, Department of Physics, Shivaji University, Kolhapur-416004, India |
| Е-mail | physicssiddu@gmail.com, vijayapuri@gmail.com |
| Issue | Volume 6, Year 2014, Number 2 |
| Dates | Received 04 February 2014; revised manuscript received 14 April 2013; published online 20 June 2014 |
| Citation | S.N. Mathad, R.N. Jadhav, Varsha Phadatare, Vijaya Puri, J. Nano- Electron. Phys. 6 No 2, 02009 (2014) |
| DOI | |
| PACS Number(s) | 77.22.Ch, 07.57. – c, 02.30.Rz, 84.40.Az |
| Keywords | Electromagnetic waves (3) , Microwaves, Microstriplines, Dielectric constant (8) . |
| Annotation | The purpose of this paper is to describe the use of strontium-substituted bismuth manganites bulk ceramic superstrate on Ag thick film microstripline, to modify its response and measure complex permittivity as a function of strontium. Bismuth strontium manganites (Bi1 − xSrxMnO3) have been synthesized by solid state sintering technique. The perturbation obtained in the transmittance and reflectance of thick film microstripline due to the Bi1 − xSrxMnO3 (0.20 x 0.50) overlay has been used to obtain the permittivity at microwave frequencies in X and Ku band range. Due to the overlay of Bismuth strontium manganites (BSM) pellets a substantial increase in the effective dielectric constant was observed in X band more compared to Ku band. The in-touch overlay method provides ease loading and unloading. The perturbation obtained in the transmittance and reflectance of thick film microstripline due to the bismuth strontium manganites overlay has been used to obtain the permittivity. |
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List of References |
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