Authors | A.V. Korotun , Ya.V. Karandas |
Affiliations | Zaporizhzhya National Technical University, 64, Gogol Str., 69063 Zaporizhzhya, Ukraine |
Е-mail | andko@zntu.edu.ua |
Issue | Volume 7, Year 2015, Number 2 |
Dates | Received 19 March 2015; published online 10 June 2015 |
Citation | A.V. Korotun, Ya.V. Karandas, J. Nano- Electron. Phys. 7 No 2, 02018 (2015) |
DOI | |
PACS Number(s) | 68.35. – p, 73.20.At, 73.30. + y |
Keywords | Fermi energy, Metal film, Dielectric (25) , Work function (2) . |
Annotation | The influence of a dielectric on the oscillations of the Fermi energy of nanometer metal films has been theoretically investigated. It has been shown within the model of rectangular finite-depth asymmetric potential well that the presence of a dielectric from one side of the film leads to the reduction of the maxima and displacement of the peaks on the left side of the size dependence of the Fermi energy, in contrast to the idealized case of a hypothetical film in vacuum. The calculations have been carried out for Au, Al and Cu films on SiO2 and Al2O3. This work was supported by the Ministry of Education and Science (project №04313). |
List of References |