Thickness Calculation of Thin Transparent Conductive Membrane on the Border with a Magnetic Fluid

Автори V.V. Chekanov , N.V. Kandaurova , V.S. Chekanov
Приналежність

North Caucasus Federal University 2, Kulakova prosp., 355029 Stavropol, Russia

Е-mail candaur18@yandex.ru, oranjejam@mail.ru
Випуск Том 8, Рік 2016, Номер 4
Дати Одержано 08.10.2016, опубліковано online - 29.11.2016
Посилання V.V. Chekanov, N.V. Kandaurova, V.S. Chekanov, J. Nano- Electron. Phys. 8 No 4(1), 04045 (2016)
DOI 10.21272/jnep.8(4(1)).04045
PACS Number(s) 75.50.Mm, 79.60.Jv
Ключові слова Thin membrane (2) , Interference (3) , Electric field (6) , Magnetic fluid (21) .
Анотація The determination method of the membrane thickness of ITO (InSnO2). The magnetite nanoparticles in the electric field migrate, forming the thin layer near conductive ITO membrane with varying thickness. Lighting this structure by monochromatic plane polarized light the interference of light in the thin membrane was observed. The experimental values of the intensity of the reflected light from the surface of «ITO – layer of magnetite particles" for samples with different thickness of the conductive coating.

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