Topological Features of the Vapor-Phase SnTe Nanostructures on Polyamide

Authors Ya.P. Saliy1 , I.I. Chaviak2, І.S. Bylina1 , D.M. Freik1

1 Vasyl Stefanyk PreCarpathian National University 57, Shevchenko Str., 76018 Ivano-Frankivsk, Ukraine

2 Ivano-Frankivsk National Medical University, 2, Halyzka Str., 76000 Ivano-Frankivsk, Ukraine

Е-mail [email protected]
Issue Volume 6, Year 2014, Number 4
Dates Received 05 August 2014; published online 29 November 2014
Citation Ya.P. Saliy, I.I. Chaviak, І.S. Bylina, D.M. Freik, J. Nano- Electron. Phys. 6 No 4, 04020 (2014)
PACS Number(s) 64.60.Gj, 68.03.Fg
Keywords Tin telluride, Nanostructures (7) , Vapor-phase technology, Atomic force microscopy (9) , Growth processes.
Annotation The results of the study of nanostructures on the surface of tin telluride thin films deposited from the vapor phase on polyamide substrates by open evaporation in vacuum are presented. Computer analysis of the results of the atomic force microscopy has revealed the influence of the technological factors on the shape features and surface orientation of nanoislands. It is shown that nanostructures of various sizes are dome-shaped with a small ratio of height to lateral diameter. A weak dependence of the island symmetry on the technological factors of deposition is found.

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