Quantitative Detection of the Contrast of Electron Microscopic Images of Amorphous Nanomaterials with the Complex Chemical Composition

Authors M.Y. Bobyk, V.P. Ivanytskiy, V.S. Kovtunenko , O.Y. Svatyuk
Affiliations

State higher education institution Uzhhorod national university, Universytetska str.14, 88000, Uzhhorod, Ukraine

Е-mail [email protected]
Issue Volume 4, Year 2012, Number 2
Dates Received 30 April 2012, published online 04 June 2012
Citation M.Y. Bobyk, V.P. Ivanytskiy, V.S. Kovtunenko, O.Y. Svatyuk, J. Nano-Electron. Phys. 4 No 2, 02041 (2012)
DOI
PACS Number(s) 7.78. + s; 07.79.  – v; 61.05.J –; 68.37.Lp; 87.64.Ee
Keywords Nanomaterials (4) , Amorphous (20) , Contrast, Scattering (20) , Electron (76) , Atom (19) .
Annotation Physically strict detection of the contrast of electron microscopic images of amorphous nanomaterials has been proposed. The necessity of separation of the contribution to the contrast of different types of electron scattering by sample atoms, namely, resilient coherent, resilient non-coherent, and non- resilient, has been revealed. Simple analytical correlations for the determination of the contribution to the electron microscopic contrast of three different scattering types have been deduced.

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