The Use of Nuclear Scanning Microprobe to Study Radiation-Induced Migration of Impurities at the Grain Boundaries in Construction Materials
| Authors | A.V. Romanenko, A.G. Ponomarev |
| Affiliations | Institute of Applied Physics National Academy of Sciences of Ukraine, 58, Petropavlovskaja St., 40000 Sumy, Ukraine |
| Е-mail | |
| Issue | Volume 8, Year 2016, Number 1 |
| Dates | Received 28 November 2015; published online 15 March 2016 |
| Citation | A.V. Romanenko, A.G. Ponomarev, J. Nano- Electron. Phys. 8 No 1, 01014 (2016) |
| DOI | 10.21272/jnep.8(1).01014 |
| PACS Number(s) | 29.30.Ep |
| Keywords | Nuclear scanning microprobe, Construction material, Impurity (5) , Micro-PIXE method, Sulfur film. |
| Annotation | The application of scanning nuclear microprobe for study a radiation-induced migration of impurities at the grain boundaries in structural materials was considered. The work describes the sample preparation for a further irradiation of microscopic areas which include a few grains. Copper samples with deposited sulfur film were used in the present work. Determinations of a chemical composition of the samples, as well as a mapping of the element distribution, were based on the analysis of characteristic paticle induced X-ray emission (PIXE). Two-dimensional distribution maps of elements, that revealed a presence of randomly distributed inclusions of silicon as a result of mechanical treatment, were obtained using the method of micro-PIXE. The quality difference of sulfur films deposited by thermal evaporation and a drop method was shown. |
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