The Use of Nuclear Scanning Microprobe to Study Radiation-Induced Migration of Impurities at the Grain Boundaries in Construction Materials

Authors A.V. Romanenko, A.G. Ponomarev
Affiliations

Institute of Applied Physics National Academy of Sciences of Ukraine, 58, Petropavlovskaja St., 40000 Sumy, Ukraine

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Issue Volume 8, Year 2016, Number 1
Dates Received 28 November 2015; published online 15 March 2016
Citation A.V. Romanenko, A.G. Ponomarev, J. Nano- Electron. Phys. 8 No 1, 01014 (2016)
DOI 10.21272/jnep.8(1).01014
PACS Number(s) 29.30.Ep
Keywords Nuclear scanning microprobe, Construction material, Impurity (4) , Micro-PIXE method, Sulfur film.
Annotation The application of scanning nuclear microprobe for study a radiation-induced migration of impurities at the grain boundaries in structural materials was considered. The work describes the sample preparation for a further irradiation of microscopic areas which include a few grains. Copper samples with deposited sulfur film were used in the present work. Determinations of a chemical composition of the samples, as well as a mapping of the element distribution, were based on the analysis of characteristic paticle induced X-ray emission (PIXE). Two-dimensional distribution maps of elements, that revealed a presence of randomly distributed inclusions of silicon as a result of mechanical treatment, were obtained using the method of micro-PIXE. The quality difference of sulfur films deposited by thermal evaporation and a drop method was shown.

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