Authors | T.M. Grychanovs’ka , T.S. Kholod , O.A. Hrychanovs’ka, L.A. Tsygankova |
Affiliations |
Sumy State University, 2, Rymsky-Korsakov Str., 40007 Sumy, Ukraine |
Е-mail | |
Issue | Volume 8, Year 2016, Number 1 |
Dates | Received 11 January 2016; published online 15 March 2016 |
Citation | T.M. Grychanovs’ka, T.S. Kholod, O.A. Hrychanovs’ka, L.A. Tsygankova, J. Nano- Electron. Phys. 8 No 1, 01018 (2016) |
DOI | 10.21272/jnep.8(1).01018 |
PACS Number(s) | 73.43.Qt, 75.70.Ak, 75.70.Cn |
Keywords | Structural-phase state, Magnetoresistance (6) , Three-layer film system, Annealing (16) . |
Annotation |
The structural-phase state and magnetoresistive properties of three-layer film systems based on Ni and V and Ni and Au or Ag total thickness d = 25-55 nm thick steel spacer ds = 5 nm. Experimentally tested the influence of annealing temperatures from 300 to 600-700 K and the total thickness of the sample on the value and nature of the magnetoresistive magnetoresistance dependencies. Established that the annealing temperature range in said film system Ni/Ag/Ni retain negative isotropic magnetoresistance, samples of Ni/Au/Ni with anisotropic magnetoresistance and magnetoresistance film system Ni/V/Ni is very sensitive to changes in the overall thickness of the sample is can be as isotropic and anisotropic magnetoresistance so. |
List of References |