Effect of Annealing on Structural-phase State and Three-layered Film Magnetoresistance Systems Based on Ni and V as well as Ni and Au or Ag

Authors T.M. Grychanovs’ka , T.S. Kholod , O.A. Hrychanovs’ka, L.A. Tsygankova
Affiliations

Sumy State University, 2, Rymsky-Korsakov Str., 40007 Sumy, Ukraine

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Issue Volume 8, Year 2016, Number 1
Dates Received 11 January 2016; published online 15 March 2016
Citation T.M. Grychanovs’ka, T.S. Kholod, O.A. Hrychanovs’ka, L.A. Tsygankova, J. Nano- Electron. Phys. 8 No 1, 01018 (2016)
DOI 10.21272/jnep.8(1).01018
PACS Number(s) 73.43.Qt, 75.70.Ak, 75.70.Cn
Keywords Structural-phase state, Magnetoresistance (5) , Three-layer film system, Annealing (16) .
Annotation

The structural-phase state and magnetoresistive properties of three-layer film systems based on Ni and V and Ni and Au or Ag total thickness d = 25-55 nm thick steel spacer ds = 5 nm. Experimentally tested the influence of annealing temperatures from 300 to 600-700 K and the total thickness of the sample on the value and nature of the magnetoresistive magnetoresistance dependencies. Established that the annealing temperature range in said film system Ni/Ag/Ni retain negative isotropic magnetoresistance, samples of Ni/Au/Ni with anisotropic magnetoresistance and magnetoresistance film system Ni/V/Ni is very sensitive to changes in the overall thickness of the sample is can be as isotropic and anisotropic magnetoresistance so.

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