Автори | A.T. Morchenko , L.V. Panina , V.G. Kostishyn |
Афіліація | National University of Science and Technology, MISiS, 4, Leninskiy Pr., 119991 Moscow, Russia |
Е-mail | dratm@mail.ru |
Випуск | Том 6, Рік 2014, Номер 3 |
Дати | Одержано 19.05.2014, опубліковано online - 15.07.2014 |
Цитування | A.T. Morchenko, L.V. Panina, V.G. Kostishyn, J. Nano- Electron. Phys. 6 No 3, 03075 (2014) |
DOI | |
PACS Number(s) | 75.50.Kj, 75.30.Gw, 75.60.Ej, 85.75.Ss |
Ключові слова | Amorphous magnetic microwire (2) , Magnetoimpedance element, Magnetization (18) , Circumferential (helical) magnetic anizotropy, Magnetic field (7) , Bias current (field). |
Анотація | One of important condition for the successful development of effective magnetic field sensors based on amorphous ferromagnetic microwires is to identify factors affecting the reversal processes in the surface layer of the magnetoimpedance wire. In this paper, the distribution of magnetization is considered as a function of the magnetic properties of the wire material, current flowing through it, strength and orientation of the external magnetic field. The impact of these factors on the performance of the sensor is analyzed on the basis of the numerical simulation of the sensor element |
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