Electrical and Photoresponse Properties of NiFe2O4/InSe Heterojunction

Authors V.I. Ivanov1 , I.G. Tkachuk1 , 3 , I.G. Orletskii2, Z.D. Kovalyuk1 , M.V. Tovarnitskii1, B.V. Kushnir1
Affiliations

1Institute for Problems of Materials Science, Chernivtsi Branch, 58001 Chernivtsi, Ukraine

2Yuriy Fedkovych Chernivtsi National University, 58012 Chernivtsi, Ukraine

3Bukovinian State Medical University, 58002 Chernivtsi, Ukraine

Е-mail ivan.tkachuk.1993@gmail.com
Issue Volume 16, Year 2024, Number 4
Dates Received 18 May 2024; revised manuscript received 21 August 2024; published online 27 August 2024
Citation V.I. Ivanov, I.G. Tkachuk, et al., J. Nano- Electron. Phys. 16 No 4, 04028 (2024)
DOI https://doi.org/10.21272/jnep.16(4).04028
PACS Number(s) 73.40. – c, 78.66. – w
Keywords Indium Selenide, Heterostructures (2) , Spray pyrolysis (9) , I-V characteristics (2) , Photoresponse.
Annotation

The conditions of application thin semiconducting ferrite NiFe2O4 films on n-InSe crystalline layered semiconductor substrates at a temperature of 623 K by the spray-pyrolysis method for the creation of photosensitive n-NiFe2O4/n-InSe heterojunctions were studied. The mechanisms of current flow through the heterojunction were established based on the temperature dependence of forward and reverse I-V characteristics. The spectral photosensitivity of the n-NiFe2O4/n-InSe heterojunction in the energy range of 1.26÷3.2 eV was analyzed.

List of References