Planar Defects Impact on Non-fundamental Efficiency Losses in mc-Si Solar Cells
| Authors | A.V. Prykhodko1,2 |
| Affiliations |
1Zaporizhzhya State Medical University, 26, Mayakovsky Ave. 69035 Zaporizhzhia, Ukraine 2Zaporizhzhya National University, 66, Zhukovsky St., 69600 Zaporizhzhya, Ukraine |
| Е-mail | |
| Issue | Volume 11, Year 2019, Number 3 |
| Dates | Received 27 August 2018; revised manuscript received 11 June 2019; published online 25 June 2019 |
| Citation | A.V. Prykhodko, J. Nano- Electron. Phys. 11 No 3, 03019 (2019) |
| DOI | https://doi.org/10.21272/jnep.11(3).03019 |
| PACS Number(s) | 88.40.Jj |
| Keywords | Solar cell (51) , mc-Si (2) , Fill factor (2) , Parasitic ohmic resistance, Dark saturation current, Diode ideality factor, Grain boundary, Stacking fault, Twin. |
| Annotation |
Planar defects can severely limit the efficiency of multicrystalline silicon (mc-Si) solar cells for a lot of reasons. The impact of grain boundaries, twins and stacking faults on fill factor losses in mc-Si solar cells has been studied. No any clear influences of planar defects presence on parasitic resistances and minority carrier lifetime were observed. The mechanism resulting in an increase of recombination component of p-n junction saturation current due to the Suzuki interaction of stacking faults with some metal traces was proposed. The possibilities for useful stacking fault engineering during ingot solidification, its cutting and wafering were discussed. No grain boundary, twin and stacking fault effects on solar cell efficiency losses due to parasitic ohmic resistances were observed. Stacking fault clusters with deformation origin that are capable of accumulating recombination impurities have been detected besides visually observed grain and twin boundaries. When angles between planes of stacking faults and p-n junction are small, the most of depleted layers are occupied by them and recombination component of the saturation current increases significantly that results in the enhancement of efficiency losses. |
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List of References |
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