Structural and Dielectric Characterization of Sm2MgMnO6

Authors Moumin Rudra, Ritwik Maity, T.P. Sinha
Affiliations

Department of Physics, Bose Institute, 93/1, Acharya Prafulla Chandra Road, Rajabazar, Kolkata – 700009, India

Е-mail [email protected]
Issue Volume 9, Year 2017, Number 5
Dates Received 28 April 2017; revised manuscript received 19 September 2017; published online 16 October 2017
Citation Moumin Rudra, Ritwik Maity, T.P. Sinha, J. Nano- Electron. Phys. 9 No 5, 05009 (2017)
DOI 10.21272/jnep.9(5).05009
PACS Number(s) 61.05.cp, 77.22.–d, 72.20.–i.
Keywords SMMO, Rietveld Refinement, Dielectric Relaxation, Conductivity (43) .
Annotation The polycrystalline Sm2MgMnO6 (SMMO) was synthesized at 1173 K by means of sol-gel technique. Rietveld refinement of X-ray diffraction (XRD) pattern confirmed the formation of a single phase monoclinic structure with space group P21/n. The band gap achieved from UV-vis spectra shows the semiconducting nature of the material. To observe the effect of grains and grain-boundaries in the conduction process and dielectric relaxation measurements are carried out on SMMO sample at different frequencies between 313 K and 673 K. An electrical equivalent circuit consisting of the resistance and constant phase element is used to clarify the impedance data.

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