The Surface Morphology of CdTe Thin Films Obtained by Open Evaporation in Vacuum

Authors Y.P. Saliy1, L.I. Nykyruy1, R.S. Yavorskyi1,2, S.Adamiak2

1 Vasyl Stefanyk Precarpathian National University, 57, Shevchenko Str., 76000 Ivano-Frankivsk, Ukraine

2 Mathematical & Natural Science Faculty, Rzeszow University, 1, Pigonia Str., 35-959 Rzeszow, Poland

Issue Volume 9, Year 2017, Number 5
Dates Received 23 July 2017; published online 16 October 2017
Citation Y.P. Saliy, L.I. Nykyruy, R.S. Yavorskyi, S.Adamiak, J. Nano- Electron. Phys. 9 No 5, 05016 (2017)
DOI 10.21272/jnep.9(5).05016
PACS Number(s) 88.40jm; 68.55 – a(j)
Keywords Cadmium Telluride (2) , Thin films (60) , The open evaporation in vacuum method, Autocorrelation function, Fourier transformation.
Annotation The different thicknesses CdTe thin films were obtained by method of open evaporation in vacuum on glass and silicon (100) substrates. The surface of films was investigated by AFM analysis. Applying the two-dimensional discrete Fourier transform and autocorrelation function, for the first time the patterns of the structure of the surface of cadmium telluride thin films formed during the vapor phase of condensation are studied. A periodic object grid is discovered. The grid period is related to the mismatch between lattice parameters of substrate and condensate.

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