Pulsed Laser Deposited Nickel Doped Zinc Oxide Thin Films: Structural and Optical Investigations

Authors Tanveer A. Dar, Arpana Agrawal , Pratima Sen
Affiliations

Laser Bhawan, School of Physics, Devi Ahilya University, Takshashila Campus, Indore-452001, India

Е-mail [email protected]
Issue Volume 5, Year 2013, Number 2
Dates Received 15 February 2013; revised manuscript received 28 April 2013; published online 04 May 2013
Citation Tanveer A. Dar, Arpana Agrawal, Pratima Sen, J. Nano- Electron. Phys. 5 No 2, 02024 (2013)
DOI
PACS Number(s) 68.55.ag, 73.61.Ga, 79.60.Dp 71.70.Gm
Keywords Semiconductors (25) , II–VI semiconductors, Doping (20) , Exchange interactions.
Annotation Structural and optical studies has been done on Nickel doped Zinc Oxide (NixZn1 – xO, x  0.03, 0.05 and 0.07 by weight) thin films prepared by pulsed laser deposition technique. The films are characterized by X-ray diffraction, Uv-vis spectroscopy, X-ray photoelectron spectroscopy. We observed a slight red shift in the optical band gap in the NiZnO subsequent to Ni doping. This shift can be assigned due to the sp-d exchange interaction of Ni- d states with s and p-states of ZnO. Also X-ray photoelectron spectroscopy studies show that Ni has well substituted in + 2 oxidation state by replacing Zn2+.

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