| Authors | R. Kumar1,2, P. Bhargava1 |
| Affiliations |
1Indian Institute of Technology (IIT), Bombay, 400076 Mumbai, India 2Thapar Institute of Engineering and Technology, 147004 Patiala, India |
| Е-mail | kumarrahul003@gmail.com |
| Issue | Volume 18, Year 2026, Number 5 |
| Dates | Received 14 April 2026; revised manuscript received 21 October 2026; published online 28 October 2026 |
| Citation | R. Kumar, P. Bhargava, J. Nano- Electron. Phys. 18 No 5, 05011 (2026) |
| DOI | https://doi.org/10.21272/jnep.18(5).05011 |
| PACS Number(s) | 88.40.jr |
| Keywords | Photovoltaics (4) , Encapsulant materials, Electrical properties of encapsunats, Thermal properties of encapsulants. |
| Annotation |
Encapsulant materials play a crucial role in the performance, durability, and reliability of silicon-based photovoltaic (PV) modules. They protect solar cells from environmental exposure, provide electrical insulation, and enhance mechanical stability. High optical transparency of encapsulants is essential for efficient light transmission and, consequently, for maximizing the energy output of PV modules. In addition, encapsulants should exhibit excellent UV resistance, thermal stability, and chemical resistance to ensure the long-term reliability of solar panels.In this study, polyolefin polymer encapsulant films were obtained from two different companies, referred to as Company-1 and Company-2. The objective of this work is to investigate and compare their structural, thermal, optical, and electrical properties. The structural and optical characteristics were analyzed using Fourier-transform infrared (FTIR) spectroscopy, Raman spectroscopy, thermogravimetric analysis (TGA), and UV–visible spectroscopy. The electrical properties were evaluated using a broadband dielectric spectrometer. The investigated electrical parameters include dielectric constant (permittivity), electric modulus, and volume resistivity. |
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