| Authors | Priyanka Gupta1, Vijay Gautam1, Bijendra Prasad1, Pankaj Sharma2 |
| Affiliations |
1Delhi Technological University, New Delhi, India 2Guru Tegh Bahadur Institute of Technology, New Delhi, India |
| Е-mail | vijaygautam@dce.ac.in |
| Issue | Volume 18, Year 2026, Number 5 |
| Dates | Received 24 April 2026; revised manuscript received 20 October 2026; published online 28 October 2026 |
| Citation | Priyanka Gupta, Vijay Gautam, et al., J. Nano- Electron. Phys. 18 No 5, 05015 (2026) |
| DOI | https://doi.org/10.21272/jnep.18(5).05015 |
| PACS Number(s) | 07.05.Tp, 85.85. + j |
| Keywords | MEMS actuator, Pull-in voltage (2) , Fixed-fixed beam, U-shape cantilever, von Mises stress, Electrostatic actuation, COMSOL Multiphysics, Finite element analysis. |
| Annotation |
This study presents a systematic coupled electromechanical finite element investigation of eighteen MEMS actuator configurations in COMSOL Multiphysics, covering two geometries (fixed-fixed beam and U-shaped cantilever), three structural materials (Au, Mo, W), and three beam lengths (100, 150, 230 m). For each case, parametric voltage sweeps deliver pull-in voltages, displacement and von Mises stress versus voltage, full arc-length spatial profiles, and 3D volumetric field renderings at near-pull-in conditions. Pull-in voltages range from 0.68 V to 11.5 V and confirm E1/2 modulus and L − 3/2 length scaling laws. The U-shape geometry yields a 14 to 50 % voltage lift over the fixed-fixed beam, growing with arm length. Three-dimensional COMSOL maps identify anchor-junction and bridge-corner fatigue hot spots invisible to 1D analysis. Stress safety margins exceed 24 times in every case, confirming electromechanical instability as the universal failure mode. |
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