Structural, Optical, and Dielectric Properties of Zinc Oxide Thin Films Obtained by Impedance Spectroscopy
| Authors | H. Benattou |
| Affiliations |
Electronics Department, Laboratory of Elaboration and Characterizations of the Materials, Djillali Liabes University of Sidi Bel Abbes, Sidi Bel Abbes, Algeria |
| Е-mail | h.benattou@gmail.com |
| Issue | Volume 18, Year 2026, Number 5 |
| Dates | Received 13 February 2026; revised manuscript received 20 October 2026; published online 28 October 2026 |
| Citation | H. Benattou, J. Nano- Electron. Phys. 18 No 5, 05013 (2026) |
| DOI | https://doi.org/10.21272/jnep.18(5).05013 |
| PACS Number(s) | 73.50. – h, 73.63.Bd |
| Keywords | Zinc oxide (10) , Thin films (60) , Impedance spectroscopy (4) , Dielectric properties (6) . |
| Annotation |
Zinc Oxide thin films were successfully grown on glass substrates by the spray pyrolysis technique. The structural properties have been identified using X-ray diffraction spectra. The deposited films are of polycrystalline natures, they are of the compact hexagonal system. The optical properties were also studied using transmittance and reflectance measurements in the wavelength range of (200-2500 nm). Electrical impedance in complex form of thin films was measured in terms of frequency and temperature using HP4192 impedance meter. Semicircular arcs were obtained and were theoretically simulated to get the equivalent circuit parameters and to model the different processes taking place in the solid thin films. AC conductivity study expresses the behavior of disordered materials where the CBH (Correlated Barrier Hopping) model is the predominant. The complex permittivity obtained from electrical measurements reflects losses and dissipation of energy in thin films; and it attributed to the interfacial and dipolar polarization. |
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List of References |
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