Authors | V.F. Onyshchenko , L.A. Karachevtseva |
Affiliations |
V.Ye. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine, 03028 Kyiv, Ukraine |
Е-mail | onyshchenkovf@isp.kiev.ua |
Issue | Volume 17, Year 2025, Number 1 |
Dates | Received 14 January 2025; revised manuscript received 15 February 2025; published online 27 February 2025 |
Citation | V.F. Onyshchenko, L.A. Karachevtseva, J. Nano- Electron. Phys. 17 No1, 01022 (2025) |
DOI | https://doi.org/10.21272/jnep.17(1).01022 |
PACS Number(s) | 78.20. – e |
Keywords | Reflection (7) , Transmission (16) , Two-layer porous silicon. |
Annotation |
The reflection and absorption of two-layer porous silicon was calculated. Two-layer porous silicon has less reflection than single-layer porous silicon and single-crystal silicon. The reflectance of two-layer porous silicon decreases to a certain value, and then it increases when the volume fraction of the pores of the first layer of porous silicon increases. The volume fraction of the pores of the first layer of porous silicon is greater than the volume fraction of the pores of the second layer of porous silicon. Layers of porous silicon are considered effective media. The lowest reflection of two-layer macroporous silicon is found by optimizing the volume fraction of pores of each layer of porous silicon. The decrease in reflection of two-layer porous silicon compared to the reflection of porous silicon with one layer of macropores is explained. The reflection of two-layer porous silicon exceeds the reflection of single-layer porous silicon and single-crystal silicon when the volume fraction of the pores of the first layer of porous silicon is small and that of the second layer of porous silicon is large. The absorption of two-layer porous silicon with optimized pore volume fractions is 0.88. |
List of References |