Автори | Omar Souilah1, A. Benzair2, B. Dennai3, H. Khachab3 |
Афіліація |
1Laboratory of Study of Materials and Optics Instrumentations, University of Sidi Bel-Abbes, 22000 Algeria 2Laboratory of Modeling and simulation in multi-scale, University of Sidi Bel-Abbes, 22000Algeria 3Laboratory in semiconductor device University of Bechar, 08000 Algeria |
Е-mail | omar.souilah2@gmail.com |
Випуск | Том 10, Рік 2018, Номер 4 |
Дати | Одержано 27.02.2018; опубліковано online 25.08.2018 |
Цитування | Omar Souilah, A. Benzair, et al., J. Nano- Electron. Phys. 10 № 4, 04013 (2018) |
DOI | https://doi.org/10.21272/jnep.10(4).04013 |
PACS Number(s) | 84.60.Jt, 88.40.jm |
Ключові слова | Solar cell (51) , Tandem (3) , Simulation (35) , PIN structure, AMPS-1D (10) , Efficiency (24) , InGaN (5) . |
Анотація |
In this work we have studied The effect of thickness of the intrinsic layer in the PIN structure of InGaN tandem solar cells such as photo generation rate, efficiency and recombination rate through the cells. Improvement around of 13 % of PIN tandem solar cell over PN tandem solar cell is observed for low doping concentration (NA 1016 cm – 3; ND 1018 cm – 3) and surface recombination (103cm/s). The photo-generated short-circuit current density (Jsc) and the open-circuit voltage (Voc) of structures under AM 1,5G (one sun) illumination, are simulated for different thickness of intrinsic layer varying from 50 nm to 350 nm. |
Перелік посилань |