Modeling of X-Ray Phase Contrast Imaging of Optically Heterogeneous Objects

Authors A.Yu. Ovcharenko, О.А. Lebed  

Institute of Applied Physics, National Academy of Sciences of Ukraine, 40000 Sumy, Ukraine

Issue Volume 16, Year 2024, Number 2
Dates Received 10 January 2024; revised manuscript received 18 April 2024; published online 29 April 2024
Citation A.Yu. Ovcharenko, О.А. Lebed, J. Nano- Electron. Phys. 16 No 2, 02021 (2024)
PACS Number(s) 42.25.Bs, 42.30.Va
Keywords Multilayer object, X-ray Phase Contrast imaging, X-ray Diffraction (19) , Fresnel-Kirchhoff Diffraction Theory, Phase Profile.

The work relates to the study of the internal multi-layered structure of optically inhomogeneous objects by the X-ray phase contrast imaging method, which is an urgent issue of modern science, technology, nuclear physics and medicine. X-ray phase-contrast imaging makes it possible to examine weakly absorbing objects, reduce the radiation dose and increase the spatial resolution. Computer modeling of X-ray diffraction within the Fresnel-Kirchhoff scalar diffraction theory was used as the research method. An algorithm was developed for creating a model of a multilayer object with different values of the refraction decrement, which allows to specify the shape, size, number and thickness of layers, and the refractive index of each layer of the object. X-ray phase-contrast image was obtained for a multilayer object with a proportional decrease in the refraction decrement from the center to the edges by the free propagation approach. A comparative analysis was carried out with an X-ray image of a homogeneous object of the same size and shape. It is shown that the modeling result contains quantitative information about the internal structure of the object and its multi-layered nature.

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