Peak Profile Analysis of X-ray Diffraction Pattern of Zinc Oxide Nanostructure

Authors Sajal Sahu1, Pijus Kanti Samanta2

1Department of Physics, Ramchandrapur Raisuddin High School, Purba Medinipur, West Bengal, India

2Department of Physics (UG & PG), Prabhat Kumar College, Contai, Purba Medinipur, West Bengal, India

Issue Volume 13, Year 2021, Number 5
Dates Received 16 April 2021; revised manuscript received 20 October 2021; published online 25 October 2021
Citation Sajal Sahu, Pijus Kanti Samanta, J. Nano- Electron. Phys. 13 No 5, 05001 (2021)
PACS Number(s) 61.46. + w, 61.46.Df, 61.82.Rx
Keywords Crystalline (14) , Grain (11) , Strain (10) , Anisotropy (3) .

X-ray diffraction is an important tool to analyze the crystal structure of any crystalline material. By appropriate analysis of X-ray diffraction peaks, the crystallite size and microstrain can be determined. Other parameters such as growth anisotropy, crystallinity, dislocation density and specific surface area can also be determined. We studied here the X-ray diffraction pattern of ZnO nanorods. The crystallite size and strain were calculated for all diffraction peaks of the pattern. The average value of the crystallite size was 47.7 nm. The strain was found to be different for different crystallographic planes. Using the standard formula, the lattice parameters of the wurtzite structure were calculated and found to be equal to a  b  3.2467 Å and c  5.2004 Å. The prepared sample has a very large average specific surface area of 2.26×105 cm2g – 1. The intensities of various diffraction peaks are different indicating that the growth of the crystal is anisotropic.

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