Bonding Analysis of [Au (3.16 nm)/Co (1.5 nm)]x35/Si (100) Multilayer Thin Film

Authors R. Bisen1,2 , J. Tripathi2 , D. Kumar3, J. Singh2, A. Sharma1

1Department of Physics, Manipal University Jaipur, Jaipur, India

2Department of Physics, IPS Academy, Indore (M.P.), India

3UGC-DAE Consortium for Scientific Research, Indore (M.P.), India

Issue Volume 13, Year 2021, Number 2
Dates Received 10 January 2021; revised manuscript received 25 March 2021; published online 09 April 2021
Citation R. Bisen, J. Tripathi, et al., J. Nano- Electron. Phys. 13 No 2, 02012 (2021)
PACS Number(s) 52.77.Dq, 61.05.cj,
Keywords Electron beam evaporation, XANES, EXAFS (2) , Thin film (101) , Multilayer (11) .

The bond lengths and other local structure parameters of [Au (3.16 nm)/Co (1.5 nm)]x35/Si (100) having ultra-thin individual layers were investigated using X-ray Absorption Spectroscopy (XAS). The multilayer structure was synthesized by electron beam evaporation method under ultra-high vacuum environment. To make a composition of 20 weight percent (wt. %) of Co atoms in Au matrix, the thickness and number of layers were specifically chosen. For the XAS measurements, LIII-absorption edge (11919 eV) of Au and K-absorption edge (7709 eV) of Co atom were used. A theoretical model was generated by using crystallographic information file (CIF) of both (Au and Co) atoms and then a computer software package IFEFFIT was used for fitting and data analysis. In this study, the short-range order structural geometry of individual layers such as oxidation state, surrounding atomic information, edge shift, bond distance and Debye-Waller factor were analyzed.

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