Authors | М.G. Khrypunov , R.V. Zaitsev , D.A. Kudii , A.L. Khrypunova |
Affiliations |
National Technical University «Kharkiv Polytechnic Institute», 2, Kyrpychov Str., 61002 Kharkiv, Ukraine |
Е-mail | |
Issue | Volume 10, Year 2018, Number 1 |
Dates | Received 21 January 2018; published online 24 February 2018 |
Citation | М.G. Khrypunov, R.V. Zaitsev, et al. J. Nano- Electron. Phys. 10 No 1, 01016 (2018) |
DOI | 10.21272/jnep.10(1).01016 |
PACS Number(s) | 68.55.Jk, 68.47.Fg |
Keywords | Cadmium Telluride films, Amplitude-time characteristics, X-ray diffractometry (2) , Scanning electron microscopy (16) , Melted high-conductivity channel. |
Annotation |
The amplitude-time characteristics of switching in thin films of cadmium telluride were investigated when single impulses of 1 μs duration are applied. It has been experimentally established that with an increase in the thickness of the cadmium telluride layer from 3 mm to 8 mm, an increase in the operating threshold from 70 V to 105 V is observed. The maximum residual sample voltage varies from 12 V to 40 V, the minimum – from 5 V to 20 V. The switching time of the samples was no more than 2 nanoseconds; the interelectrode capacity of the samples was no more than 2 pF. All the test samples were operated without failure 20 times. The structural studies of cadmium telluride films by the method of X-ray diffractometry and scanning electron microscopy have made it possible to propose a mechanism for realizing the monostable switching of the columnar structure of cadmium telluride films oriented in the form of melted high-conductivity channels in grains oriented in the [111] direction. |
List of References |