Strain Properties of Thin Film Nanostructures Based on Permalloy and Silver

Authors D.O. Shuliarenko, O.V. Pylypenko , K.V. Tyschenko , I.M. Pazukha, L.V. Odnodvorets
Affiliations

Sumy State University, 2, Rimsky Korsakov Str., 40007 Sumy, Ukraine

Е-mail iryna.pazukha@gmail.com
Issue Volume 10, Year 2018, Number 1
Dates Received 12 December 2017; revised manuscript received 14 January 2018; published online 24 February 2018
Citation D.O. Shuliarenko, O.V. Pylypenko, et al., J. Nano- Electron. Phys. 10 No 1, 01011 (2018)
DOI 10.21272/jnep.10(1).01011
PACS Number(s) 60.68.Bs, 72.10.Fk, 73.63.Bd
Keywords Thin film nanostructures, Co-evaporation, Strain properties, Concentration dependence.
Annotation

The results of investigation strain properties (integral (γl)int and differential (γl)dif  strain coefficients) of thin film nanostructures based on permalloy Ni80Fe20 (Ру) silver (Ag), prepared by method of co-evaporation from independent sources, and results for components of the systems are presented. The main peculiarities of Py and Ag strain properties in the range of thicknesses d = 10-60 nm are determinate. It has been shown that the maximum at the сAg = 30-36 at.% is observed at the concentration dependences of (γl)int. The presence of a maximum is due to the structural changes in the film systems.

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