Authors | D.O. Shuliarenko, O.V. Pylypenko , K.V. Tyschenko , I.M. Pazukha , L.V. Odnodvorets |
Affiliations |
Sumy State University, 2, Rimsky Korsakov Str., 40007 Sumy, Ukraine |
Е-mail | iryna.pazukha@gmail.com |
Issue | Volume 10, Year 2018, Number 1 |
Dates | Received 12 December 2017; revised manuscript received 14 January 2018; published online 24 February 2018 |
Citation | D.O. Shuliarenko, O.V. Pylypenko, et al., J. Nano- Electron. Phys. 10 No 1, 01011 (2018) |
DOI | 10.21272/jnep.10(1).01011 |
PACS Number(s) | 60.68.Bs, 72.10.Fk, 73.63.Bd |
Keywords | Thin film nanostructures, Co-evaporation, Strain properties, Concentration dependence. |
Annotation |
The results of investigation strain properties (integral (γl)int and differential (γl)dif strain coefficients) of thin film nanostructures based on permalloy Ni80Fe20 (Ру) silver (Ag), prepared by method of co-evaporation from independent sources, and results for components of the systems are presented. The main peculiarities of Py and Ag strain properties in the range of thicknesses d = 10-60 nm are determinate. It has been shown that the maximum at the сAg = 30-36 at.% is observed at the concentration dependences of (γl)int. The presence of a maximum is due to the structural changes in the film systems. |
List of References |