Structural Investigation of Sbgese Glasses by High Resolution X-Ray Photoelectron Spectroscopy

Authors D.C. Sati1,2, L.P. Purohit2, R.M. Mehra3 , A. Kovalski1, R. Golovchak1, H. Jain1

1 International Materials Institute for New Functionality in Glass, Lehigh University, 18015, Bethlehem, PA, USA

2 Department of Physics, Gurukula Kangri University, 249 404, Hardwar, India

3 School of engineering and technology, Sharda University, 201308, Greater Noida, India

Е-mail [email protected]
Issue Volume 3, Year 2011, Number 1, Part 2
Dates Received 04 February 2011, in final form 02 May 2011, published online 08 May 2011
Citation D.C. Sati, L.P. Purohit, R.M. Mehra, J. Nano- Electron. Phys. 3 No1, 302 (2011)
PACS Number(s) 81.05.Kf, 81.05.Gc 31.10.+ z, 82.80.Pv, 33.15.Fm
Keywords Amorphous chalcogenide, X-ray photoelectron spectroscopy (3) , Chemical bonds.
The evolution of the structure of Sb8Ge32Se60 (Z=2.72) and Sb20Ge20Se60 (Z=2.60) chalcogenide glasses is determined by high resolution X-ray photoelectron spectroscopy. Glasses with Z=2.60 the structure consists of deformed tetrahedra and pyramids, in which at least one Se atom is substituted by Ge or Sb atom. For the Z=2.72 structure consisting of shared pyramids and tetrahedra with two or more Se atoms substituted by the cations. At the same time, Se-Se dimers are present in both compositions.

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