Authors | Y. Larbah , M. Taibeche, B. Rahal , H. Brahimi |
Affiliations |
Nuclear Research Center of Algiers, 16000 Algiers, Algeria |
Е-mail | |
Issue | Volume 16, Year 2024, Number 5 |
Dates | Received 20 June 2024; revised manuscript received 21 October 2024; published online 30 October 2024 |
Citation | Y. Larbah, M. Taibeche, B. Rahal, H. Brahimi, J. Nano- Electron. Phys. 16 No 5, 05024 (2024) |
DOI | https://doi.org/10.21272/jnep.16(5).05024 |
PACS Number(s) | 73.40. – c, 78.66. – w |
Keywords | ZnO (92) , ZnO:Al (2) , Spray (12) , Microstructural analyze, Electric and optical properties. |
Annotation |
The Highly transparent and conducting aluminum doped zinc oxide thin films deposited on glass substrate held at 450°C using spray pyrolysis method. The structural analysis by X-rays diffraction showed that the films are of structure wurtzite with a preferential orientation according to the direction (002) for oxide zinc ZnO undoped, on the other that ZnO: Al has a direction (101). The crystallite size was varied from 34 to 36 nm with dopant concentration. The scanning electron microscopy results depicted that the microstructure of ZnO: Al films highly influenced by the aluminum doping. The measures optical showed that ZnO: Al layers have a transmission of about 85% and energy gap of 3.2 eV, 3.4 eV for ZnO:Al and ZnO respectively. The resistivity of the films decreased as increase the dopant concentration and it is 3 × 10−2 cm for 1 at.% Al beyond which it increased. |
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