Surface Plasmon's Dispersion Properties of Vanadium Oxide Films
| Authors | I. Matyash , I. Minailova , O. Gudymenko, T. Sabov, O. Dubikovskyi, O. Kosulya , O. Kulbachynskyi , P. Lytvyn |
| Affiliations |
Lashkarev Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 03028 Kiev, Ukraine |
| Е-mail | irinaminailova125@gmail.com |
| Issue | Volume 16, Year 2024, Number 5 |
| Dates | Received 18 June 2024; revised manuscript received 22 October 2024; published online 30 October 2024 |
| Citation | I. Matyash, I. Minailova, O. Gudymenko, et al., J. Nano- Electron. Phys. 16 No 5, 05001 (2024) |
| DOI | https://doi.org/10.21272/jnep.16(5).05001 |
| PACS Number(s) | 42.25.Ja, 42.68.Ay |
| Keywords | Modulation polarimetry technique, Polarization (6) , VO2 thin films, Dispersion properties, Gaussian functions. |
| Annotation |
Vanadium dioxide (VO2) is a typical metal-insulator transition material, which changes from room-temperature monoclinic insulating phase to high-temperature rutile metallic phase. The phase transition of VO2 is accompanied by sudden changes in conductance and optical transmittance. Due to the excellent phase transition characteristics of VO2, it has been widely studied in the applications of electric and optical devices, smart windows, sensors, actuators, etc. The dispersion properties of thin vanadium dioxide films were researched using the modulation polarimetry (MP) technique. VO2 thin films were deposited on quartz glass substrates by magnetron sputtering of the VO2 target. The films had different modifications of composition, structure, morphology, and optical properties due to the manufacturing technology. The main measured parameter of the MP technique is the polarization difference between the internal reflection coefficients of linearly polarized light with an electric field azimuth perpendicular and parallel to the plane of incidence. The spectral dependences of the polarization reflection difference were measured at different angles of light incidence for several samples. Spectral dependences of the polarization absorption difference were shown. Also, the dispersion characteristics of surface plasmonic polaritons appearing at the film-air interface were shown. The value of the group velocity of excitation of surface plasmons for all films was determined from the slope of the frequency depending on the wave vector. The proposed method makes it possible to conclude the film morphology. The crystal structure of the films was investigated using an X-ray diffractometer. The surface nanorelief of annealed vanadium dioxide films were studied using atomic force microscopy. |
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