Determination of the Nanoparticle Sizes Using AFM Images and Simulation of their Magnetooptical Properties
| Authors | V.A. Zlenko , M.H. Demydenko , S.I. Protsenko |
| Affiliations | Sumy State University, 2, Rimsky-Korsakov Str., 40007 Sumy, Ukraine |
| Е-mail | |
| Issue | Volume 5, Year 2013, Number 3 |
| Dates | Received 10 September 2013; published online 17 October 2013 |
| Citation | V.A. Zlenko, M.H. Demydenko, S.I. Protsenko, J. Nano- Electron. Phys. 5 No 3, 03055 (2013) |
| DOI | |
| PACS Number(s) | 61.46.Df, 68.37.Lp, 73.61.At, 81.15.Ef |
| Keywords | Atomic-force microscopy, Nanoparticle array, MOKE (2) . |
| Annotation | This paper describes the geometric models and presents the calculation results of the actual sizes of Ni and Co nanoparticles on the amorphous Si3N4 / Si substrates obtained by thermal annealing of thin metal films using the data of atomic force microscopy. Results were used in the simulation of magneto-optical properties of arrays of nanoparticles. It is shown that processed by described in the paper equations models allow to obtain a good agreement between calculated and experimentally obtained by MOKE method data. |
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