Authors | V.O. Khandozhko1, M.D. Raranskii1, V.N. Balazjuk1, Z.D. Kovalyuk2 |
Affiliations | 1 Yuriy Fedkovych Chernivtsi National University, 2, Kotsjubynskyi Str., 58012 Chernivtsi, Ukraine 2 Chernivtsi department of Institute of material problems of NAS of Ukraine, 5, Vilde Str., 58001 Chernivtsi, Ukraine |
Е-mail | |
Issue | Volume 5, Year 2013, Number 3 |
Dates | Received 31 May 2013; published online 17 October 2013 |
Citation | V.O. Khandozhko, M.D. Raranskii, V.N. Balazjuk, Z.D. Kovalyukб J. Nano- Electron. Phys. 5 No 3, 03050 (2013) |
DOI | |
PACS Number(s) | 76.60. – К, 76.60.Gv, 41.50. + h |
Keywords | NQR, Layered compounds, Crystallographic orientation, Crystal annealing. |
Annotation | The dependence of the spectrum intensity on the orientation of crystallographic axes of anisotropic crystal with respect to the magnetic component vector of high-frequency field was studied using NQR method. The existence of residual intensity of the resonance spectrum while Н1c indicates the presence of defects in single crystal – blocks with small angle boundaries or other violations of atomic layers. Crystal annealing at the temperature of 550C is accompanied by improvment of quality of NQR resonance spectra and diffraction maxima at topograms. |
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