SIMS Analysis of Copper-Nickel Thin Films Alloys
| Authors | V.B. Loboda1 , V.M. Zubko1, S.M. Khursenko1 , A.I. Saltykova2 , A.V. Chepizhnyi1 |
| Affiliations |
1Sumy National Agrarian University, 40021 Sumy, Ukraine 2Sumy State Pedagogical University named after A.S. Makarenko, 40002 Sumy, Ukraine |
| Е-mail | loboda-v@i.ua |
| Issue | Volume 16, Year 2024, Number 1 |
| Dates | Received 05 January 2024; revised manuscript received 16 February 2024; published online 28 February 2024 |
| Citation | V.B.Loboda, V.M. Zubko, S.M. Khursenko, et al., J. Nano- Electron. Phys. 16 No 1, 01011 (2024) |
| DOI | https://doi.org/10.21272/jnep.16(1).01011 |
| PACS Number(s) | 68.55.Nq, 68.49.Sf, 82.80.Ms |
| Keywords | Secondary ion mass spectrometric analysis, Thin films (60) , Copper-nickel alloys. |
| Annotation |
The article presents the results of studying the elemental and isotopic composition of alloy films based on Cu and Ni films by the method of secondary ion mass spectrometric analysis (MS-7201 M secondary ion mass spectrometer). Films of alloys with a thickness of up to 130 nm were obtained on polished glass substrates with a pre-applied Al buffer layer by simultaneous separate evaporation of the components in a vacuum of 10 4 Pa. Copper was evaporated from a strip of tungsten foil with a thickness of 0.05 mm. Nickel was evaporated by the electron-beam method using an electron diode gun. The rate of condensation was 0.5-1.5 nm/s. The purity of evaporated metals was at least 99.98%. Ar+ ions with an energy of 5 keV were used as probing primary ions. The results of qualitative mass spectrometric analysis of secondary ions indicate the high purity of the films (absence of hydrides, oxides and carbides of Cu and Ni). The elemental composition of the films is represented by isotopes Ni58, Ni60 and Cu63, Cu65. The ratios of isotopic intensities are and which corresponds to the natural distribution of nickel and copper isotopes. The ratio of isotopic intensities practically does not change over the entire thickness of the sample. It was shown that the quantitative analysis of the elemental composition of film alloys can also be carried out by the method of secondary ion mass spectrometry. |
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