Calibration of a Microscopic Measurement System by Projection Technique of Coded Periodic Patterns

Authors H. Bouali1,2, Y. Belkacemi1, M. Bouaziz1, K. Mansouri2

1Mechanical Engineering and Development Research Laboratory, National Polytechnic School, Algiers, Algeria

2Abbes Laghrour University, 40000 Khenchela, Algeria

Issue Volume 14, Year 2022, Number 6
Dates Received 13 September 2022; revised manuscript received 20 December 2022; published online 27 December 2022
Citation H. Bouali, Y. Belkacemi, et al., J. Nano- Electron. Phys. 14 No 6, 06011 (2022)
PACS Number(s) 06.20.Fb, 07.60. – j
Keywords Periodic pattern, Projection, LFSR code, Relative position, Absolute position, Calibration.

The measurement based on the vision of periodic patterns by a remote camera is a more suitable solution for the control and characterization of micro robotic systems. In this way, we can take precise measurements without disturbing the measured objects and without the need for more devices and sensors that cause great confusion and clutter around the workspace. The technique of projection of the coded periodic patterns is perhaps effective and of goodperformanceand especially in the case of a well calibrated system. Indeed, the question arises on the influence of the calibration on the results of measurement by this technique in terms of precision and uncertainty. Thus, the main purpose of this article is to study the influence of calibration on the measurement process, by deducing and calculating the committed error and the uncertainty rate. Based on an algorithm in MATLAB, we first create a coded periodic test pattern to which we apply a certain imposed displacement. Then, we project this pattern using a projection and reduction system on a digital camera which captures a photo and transmits it to a processing algorithm, which, in turn, calculates and deduces a value for the measured displacement.The repetition of this process occurs several times on the same imposed displacement (the same standard) to provide us with several measured values, this redundancy of the data allows us to draw a calibration curve and deduce several metrological parameters from our system of measure.

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