Generalized Hurst Exponent of The Carbon Thin Film Surface

Authors V.N. Borisyuk , Jassim Kassi, A.I. Holovchenko
Affiliations Sumy State University, 2, Rimsky-Korsakov Str., 40007, Sumy, Ukraine
Е-mail [email protected]
Issue Volume 3, Year 2011, Number 4
Dates Received 23 August 2011, published online 30 December 2011
Citation V.N. Borisyuk, Jassim Kassi, A.I. Holovchenko, J. Nano- Electron. Phys. 3 No4, 20 (2011)
DOI
PACS Number(s) 05.45.Df, 68.37.Хх
Keywords Self-similarity, Carbon thin films, Hurst exponent, Fractal dimension.
Annotation
Self-similar structure of the carbon thin film surface, obtained by magnetron sputtering, is investigated numerically. Statistical parameters are calculated within two dimensional multi fractal detrended fluctuation analysis. The numerical model of the surfaces under investigation was build from the SEM images of the carbon thin film. It is shown that the self-similarity in surface structure preserves through different resolutions of the SEM images.

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