Generalized Hurst Exponent of The Carbon Thin Film Surface
| Authors | V.N. Borisyuk , Jassim Kassi, A.I. Holovchenko |
| Affiliations | Sumy State University, 2, Rimsky-Korsakov Str., 40007, Sumy, Ukraine |
| Е-mail | vad2@ukr.net |
| Issue | Volume 3, Year 2011, Number 4 |
| Dates | Received 23 August 2011, published online 30 December 2011 |
| Citation | V.N. Borisyuk, Jassim Kassi, A.I. Holovchenko, J. Nano- Electron. Phys. 3 No4, 20 (2011) |
| DOI | |
| PACS Number(s) | 05.45.Df, 68.37.Хх |
| Keywords | Self-similarity, Carbon thin films, Hurst exponent, Fractal dimension. |
| Annotation |
Self-similar structure of the carbon thin film surface, obtained by magnetron sputtering, is investigated numerically. Statistical parameters are calculated within two dimensional multi fractal detrended fluctuation analysis. The numerical model of the surfaces under investigation was build from the SEM images of the carbon thin film. It is shown that the self-similarity in surface structure preserves through different resolutions of the SEM images. |
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List of References |
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