Contrast of Electron Microscopy Images of Amorphous Objects

Authors O.Ya. Svatiuk

Uzhgorod National Universiry, 46, Pidhirna St., 88000 Uzhgorod, Ukraine

Е-mail [email protected]
Issue Volume 8, Year 2016, Number 1
Dates Received 17 November 2015; published online 15 March 2016
Citation O.Ya. Svatiuk, J. Nano- Electron. Phys. 8 No 1, 01005 (2016)
DOI 10.21272/jnep.8(1).01005
PACS Number(s) 61.05.J –, 61.05.jd, 68.37.Lp
Keywords Electron microscopy (20) , Electron diffraction, Amplitude contrast, Amorphous material, Microstructure (21) .
Annotation It has been proposed to determine the contrast in electron microscopy image via the total electron fluxes scattered beyond the aperture diaphragm by local areas of the object under study to analyze quantitatively the amplitude (absorption) contrast of the amorphous objects with different types of heterogeneities of the atomic and continual structure. The significant properties of the determined contrast are its linear dependence on the difference of electron beam fluxes that form the image and a convenient range of variation from 0 to 1 relative units.

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