Building Material Complex Permittivity at X-Band Frequencies: An Evaluation
| Authors | M. Bendaoued1 , H. Elmajid2, A. Es-saleh3 , S. Lakrit4 , V. Satyanarayana5 , M. Lakshmana Kumar6 |
| Affiliations |
1LMEET Laboratory, Hassan I University, Faculty of Sciences and Technology, Settat, Morocco 2Research Team in Smart Communications, E3S, Research Center, EMI, Mohammed V University, Rabat, Morocco 3Mathematics and Information Systems Laboratory, FP of Nador, Mohammed First University, Oujda, Morocco 4Mathematics and Information Systems Laboratory, EST of Nador, Mohammed First University, Oujda, Morocco 5Department of Electronics and Communication Engineering, Aditya University, Aditya Nagar, ADB Rd, Surampalem, Andhra Pradesh-533437, India 6Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Green Fields, 522302 Vaddeswaram, A.P., India |
| Е-mail | hassinfo_10@yahoo.fr |
| Issue | Volume 17, Year 2025, Number 2 |
| Dates | Received 15 February 2025; revised manuscript received 20 April 2025; published online 28 April 2025 |
| Citation | M. Bendaoued, H. Elmajid, et al., J. Nano- Electron. Phys. 17 No 2, 02017 (2025) |
| DOI | https://doi.org/10.21272/jnep.17(2).02017 |
| PACS Number(s) | 07.05.Tp |
| Keywords | Dielectric materials, Rectangular waveguide, Complex relative permittivity, X-band. |
| Annotation |
A methodology for characterizing dielectric materials frequently utilized in construction is presented. This approach entails assessing electromagnetic wave propagation properties within a waveguide containing the material under investigation, through the analysis of waveguide dimensions, measured parameters, and the implementation of calibration procedures. The method uses the Transmission/Reflection (T/R) technique to ascertain the complicated relative permittivity of various materials. A standard vector network analyzer is initially employed to estimate the Sij parameters within a rectangular waveguide containing the material under investigation in the X-band frequency spectrum (8.5 – 12.5 GHz). Subsequently, a numerical optimization process is applied to derive the complex permittivity, utilizing a MATLAB script designed to identify the complex relative permittivity of the dielectric material, aligning the measured and calculated values of the S-parameters. Specifically, two measures of transmission and reflection are employed: The preliminary measurement is performed using an empty sample holder or a dielectric reference. Conversely, in the second measurement, the sample holder is populated with the substance for characterization. The legitimacy of this approach is evidenced by experimental findings from various dielectric building materials, including Teflon, cellular concrete, and wood, in comparison with alternative ways, hence affirming the efficacy of the proposed strategy. |
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List of References |
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