Authors | T.N. Koltunowicz1, P. Zhukowski1, J.A. Fedotova2, A.V. Larkin3 |
Affiliations | 1 Lublin University of Technology, 38a, Nadbystrzycka Str., 20-618 Lublin, Poland 2 National Center for Particles and High Energy Physics of Belarusian State University, 153, Bogdanovich Str., 220040 Minsk, Belarus 3 Belarusian State University, 4, Independence Av., 220030 Minsk, Belarus |
Е-mail | t.koltunowicz@pollub.pl, pawel@elektron.pol.lublin.pl, julia@hep.by, LarkinAV@bsu.by |
Issue | Volume 4, Year 2012, Number 1 |
Dates | Received 26 September 2011; published online 14 March 2012 |
Citation | T.N. Koltunowicz, P. Zhukowski, J.A. Fedotova, A.V. Larkin, J. Nano-Electron. Phys. 4 No 1, 01002 (2012) |
DOI | |
PACS Number(s) | 3.22. – f, 68.55.Ln, 81.40.Ef, 84.37.+q |
Keywords | Nanoparticles (70) , Ion Implantation (5) , Annealing (16) , Measurement of Electrical Properties. |
Annotation | For the tested samples of the x = 38,2 at.% content it has been found that at high annealing temperatures the phase-shift angle is < 0 within the low-frequency area, while at high frequency values > 0. The analysis has shown that in the samples studied the series connection of capacity and noncoil-like inductance can be realized. Capacitive properties of LC circuit with – 90 L < 0° are presented at low frequencies and its inductive properties with 0° H < 90° become apparent at high frequencies. |
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