Authors | Prashant Mani, Manoj Kumar Pandey |
Affiliations | SRM University, NCR Campus, 201204 India |
Е-mail | prashantmani29@gmail.com, mkspandey@gmail.com |
Issue | Volume 7, Year 2015, Number 2 |
Dates | Received 16 January 2015; published online 10 June 2015 |
Citation | Prashant Mani, Manoj Kumar Pandey, J. Nano- Electron. Phys. 7 No 2, 02002 (2015) |
DOI | |
PACS Number(s) | 64.70.Q –, 85.30. – р |
Keywords | SOI (16) , Channel length, Threshold voltage (15) , 3D modeling. |
Annotation | The present paper is about the modeling of surface potential and threshold voltage of Fully Depleted Silicon on Insulator MOSFET. The surface potential is calculated by solving the 3D Poisson’s equation analytically. The appropriate boundary conditions are used in calculations. The effect of narrow channel width and short channel length for suppression of SCE is analyzed. The narrow channel width effect in the threshold voltage is analyzed for thin film Fully Depleted SOI MOSFET. |
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