Correlation of Raman and Photoluminescence Spectra of Al2O3 Capped Silicon Nanoparticles Grown by Reactive Pulsed Laser Deposition
| Автори | A.P. Detty1,2, L.M. Kukreja1, B.N. Singh1, V.G. Sathe3, T. Shripathi3, V.P. Mahadevan Pillai2 |
| Приналежність | 1 Laser Materials Processing Division, Raja Ramanna Centre for Advanced Technology, Indore, 452013, Madhya Pradesh, India 2 Department of Optoelectronics, University of Kerala, Karyavattom, 695581, Thiruvananthapuram, Kerala, India 3 UGC-DAE Consortium for Scientific Research, Khandwa Road, 452 017, Indore, Madhya Pradesh, India |
| Е-mail | dettyalappatt@gmail.com |
| Випуск | Том 3, Рік 2011, Номер 1, Part 2 |
| Дати | Received 04 February 2011, in final form 03 May 2011, published online 08 May 2011 |
| Посилання | A.P. Detty, L.M. Kukreja, B.N. Singh, et al., J. Nano- Electron. Phys. 3 No1, 323 (2011) |
| DOI | |
| PACS Number(s) | 73.21. – b, 73.22. – f |
| Ключові слова | Silicon nanoparticles (2) , Reactive pulsed laser deposition, Photoluminescence (17) , Micro-Raman spectra, Interface energy states. |
| Анотація |
Synthesis and observation of a correlation between the Raman spectra and photoluminescence (PL) of silicon nanoparticles (Si-nps) embedded in Al2O3 matrix grown by reactive pulsed laser deposition in oxygen atmosphere are reported. We observed a strong dependence of the band gap, photoluminescence intensity and Raman spectra of Si-nps on the ambient oxygen gas pressure during the deposition. It appears that with increasing oxygen pressure the enhanced oxidation of silicon into SiOx, which surrounds the Si-nps is responsible for the increase in the band gap, enhancement in the PL intensity and suppression of the Si related Raman mode observed in these studies. |
|
Перелік посилань |
Інші статті цього номера
1) Influence of Thermal Annealing on Structural and Electrical Properties of Nickel Oxide Thin Films [0225-0231]2) Electrophysical Properties of Ge/Cr Thin Films [0232-0235]
3) Double Acceptor Interaction in Semimagnetic Quantum Dot [0236-0239]
4) Elastic Constants and Its Pressure Derivative of Boron Phosphide Using Higher-Order Perturbation Theory [0240-0242]
5) Review of MEMS Test Structures for Mechanical Parameter Extraction [0243-0253]
6) Synthesis, Structural and Optical Study of CdS Nanoparticles Doped With Different Concentration of Cu [0254-0259]
7) Effect of Annealing on Structural, Optical and Electrical Behaviours of WO3 Thin Films Prepaired by Physical Vapour Deposition Method [0260-0267]
8) Electronic Structure and Magnetic Properties of Cobalt Doped Zinc Oxide [0268-0273]
9) Structural and Substructural Properties of the Zinc and Cadmium Chalcogenides Thin Films (a Review) [0274-0301]
10) Structural Investigation of Sbgese Glasses by High Resolution X-Ray Photoelectron Spectroscopy [0302-0307]
11) Thermal and Dielectric Studies on Ge10Se69Tl21 Chalcogenide Glass [0308-0312]
12) Optical Band Gap Study of Bi1-xSbx (x = 0.10, 0.15 & 0.20) Thin Films [0313-0317]
13) Comparison of Thermal Evaporation and Plasma Assisted Thermal Evaporation Processes for Deposition of tin Oxide Thin Films [0318-0322]
14) Temperature Dependent Switching Behavior of BFN Thin Films: a Wide Band Gap Semiconductor [0330-0340]
15) Electronic Properties of Tin Telluride: a First Principles Study [0341-0347]
16) Analysis of High Energy Ion, Proton and Co-60 Gamma Radiation Induced Damage in Advanced 200 GHz Sige HBTS [0348-0357]
17) Field-Emission Study of Multi-Walled Carbon Nanotubes Grown on Si Substrate by Low Pressure Chemical Vapor Deposition [0358-0361]
18) Optical and Electrochromic Properties of E-Beam Evaporated Nickel Oxide Thin Film [0362-0369]
19) Properties of Silicon Dioxide Films Prepared Using Silane and Oxygen Feeds by PE-CVD at low Power Plasma [0370-0375]
20) P-Type Transparent nio Thin Films by E-Beam Evaporation Techniques [0376-0383]
21) Excited States of a Magnetic Polaron in a Quantum Well [0383-0387]
22) Temperature Induced Stress Dependent Photoluminescence Properties of Nanocrystallite Zinc Oxide [0388-0395]
23) Magnetic, Electrical and Surface Morphological Characterization of AuGe/Ni/Au Ohmic Contact Metallization on GaAs/AlGaAs Multilayer Structures [0396-0403]
24) Thermal and Optical Study of Te15(Se100-xBix)85 (x = 0, 1, 3) Chalcogenide Glasses [0404-0408]
25) Zinc Oxide Nanostructures by Oxidation of Zinc Films Deposited on Oxidized Silicon Substrate [0409-0413]
26) Micro-Raman and UV-Vis Studies of 100 MEv Ni4+ Irradiated Cadmium Telluride Thin Films [0414-0417]
27) The Silicon-to-Silicon Anodic Bonding Using Sputter Deposited Intermediate Glass Layer [0418-0425]
28) low Temperature Effects on Electrical and Optical Properties of Vacuum Annealed Zinc Tetra- Tert- Butyl 2, 3 Naphthalocyanine Thinfilms [0426-0432]
29) Effect of Additives on Grain Size and Ammonia Sensing Properties of Sprayed Pure and CuO Modified ZnO Thin Films [0433-0440]
