Tensoresistive Properties of Thin Film Systems Based on Ag and Co
| Authors | I.M. Pazukha , Z.M. Makukha , Yu.M. Shabelnyk , I.Yu. Protsenko |
| Affiliations | Sumy State University, 2, Rimsky Korsakov Str., 40007 Sumy, Ukraine |
| Е-mail | protsenko@aph.sumdu.edu.ua |
| Issue | Volume 4, Year 2012, Number 3 |
| Dates | Received 29 September 2012; revised manuscript received 14 October 2012; published online 30 October 2012 |
| Citation | I.M. Pazukha, Z.M. Makukha, Yu.M. Shabelnyk, I.Yu. Protsenko, J. Nano- Electron. Phys. 4 No 3, 03020 (2012) |
| DOI | |
| PACS Number(s) | 60.68.Bs, 72.10.Fk, 73.63.Bd |
| Keywords | Two-layer film systems, Tensoresistive effect, Gauge factor, Strain and plastic deformation, Interface scattering. |
| Annotation |
The results of research strain deformation properties of thin films Ag, Co and two-layers films Ag/Co in the range of deformation Δεl = 0-1 % were presented. The plastic deformation in Co layer caused a similar deformation in the entire film system, even if the strain range Ag layer is not reached the limits of the transition elastic/plastic deformation. The increasing of gauge factor value of two-layer systems in comparison with thin films Ag and Co appears as a result of electron interface scattering. |
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List of References |
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