Authors | A.G. Khachatrian, O.M. Buhay |
Affiliations | Institute of Applied Physics NAS of Ukraine, 58, Petropavlivska Str., 40000 Sumy, Ukraine |
Е-mail | moyakomora@mail.ru |
Issue | Volume 6, Year 2014, Number 4 |
Dates | Received 12 December 2014; revised manuscript received 27 October 2014; published online 29 November 2014 |
Citation | A.G. Khachatrian, O.M. Buhay, J. Nano- Electron. Phys. 6 No 4, 04037 (2014) |
DOI | |
PACS Number(s) | 07.50.Qx, 29.85.Fj, 84.30.Sk |
Keywords | Extended dead time, Non-extended dead time, Pile-up, Dead time shifting, Counting characteristic, Monte Carlo simulation (3) , PIXE (2) . |
Annotation | In the conventional “extended-non-extended dead time” model it is assumed that non-extended dead time is imposed at the beginning of each registered pulse. We deduced the expression for output count rate, considering that the non-extended dead time can start at any phase of registered pulses. New mechanism of influence on the integral count rate, the so-called “dead time shifting”, is uncovered. The Monte Carlo code for output count rate modeling is developed. This code takes into account the dead time shifting effect and includes the possibility for non-extended dead time to be amplitude-dependent. We employed Monte Carlo modeling to check the theoretical formula for output count rate. Besides, modeling has been considered as the alternative way to perform dead-time correction. |
List of References English version of article |