Автори | V.N. Borisyuk, Jassim Kassi, A.I. Holovchenko |
Афіліація | Sumy State University, 2, Rimsky-Korsakov Str., 40007, Sumy, Ukraine |
Е-mail | vad2@ukr.net |
Випуск | Том 3, Рік 2011, Номер 4 |
Дати | Received 23 August 2011, published online 30 December 2011 |
Цитування | V.N. Borisyuk, Jassim Kassi, A.I. Holovchenko, J. Nano- Electron. Phys. 3 No4, 20 (2011) |
DOI | |
PACS Number(s) | 05.45.Df, 68.37.Хх |
Ключові слова | Self-similarity, Carbon thin films, Hurst exponent, Fractal dimension. |
Анотація |
Self-similar structure of the carbon thin film surface, obtained by magnetron sputtering, is investigated numerically. Statistical parameters are calculated within two dimensional multi fractal detrended fluctuation analysis. The numerical model of the surfaces under investigation was build from the SEM images of the carbon thin film. It is shown that the self-similarity in surface structure preserves through different resolutions of the SEM images. |
Перелік посилань |