Fabrication and Time Degradation Study of Mercuric Iodide (Red) Single Crystal X-Ray Detector
| Автори | Kulvinder Singh, Manoj Saxena |
| Афіліація | Department of Physics and Electronics, Deen Dayal Upadhyaya College, University of Delhi, New Delhi 110 015, India |
| Е-mail | kulvinder.physics@gmail.com |
| Випуск | Том 3, Рік 2011, Номер 1, Part 4 |
| Дати | Received 04 February 2011, published online 17 October 2011 |
| Цитування | Kulvinder Singh, Manoj Saxena, J. Nano- Electron. Phys. 3 No1, 802 (2011) |
| DOI | |
| PACS Number(s) | 81.10. – h, 07.85.Fv |
| Ключові слова | Wide band semiconductor, Mercuric iodide, Photo-conduction, X-ray sensor, Degradation and stability. |
| Анотація |
Mercuric iodide is well known semiconductor solid state X-ray detector. Stability of Mercuric Iodide detector is one of the major problems to its practical applications. In the present work, single crystal of mercuric iodide was grown from a well purified material and detector is fabricated on a fused quartz base with platinum electrodes. Degradation of detector is studied and analyzed. |
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