Structure and Surface Analysis of SHI Irradiated Thin Films of Cadmium Telluride
| Authors | Neelam Pahwa1,3, A.D. Yadav1, S.K. Dubey1, A.P. Patel1, Arvind Singh2, D.C. Kothari1,2 |
| Affiliations | 1 Department of Physics, University of Mumbai, Vidyanagari Campus, Santacruz (E), Mumbai 400098, India 2 National Centre for Nano-Materials and Nanotechnology, University of Mumbai, Mumbai 400098, India 3 Department of Electronics, Zakir Husain Delhi College, University of Delhi, Delhi-110001, India |
| Е-mail | neelam.zhc@gmail.com |
| Issue | Volume 4, Year 2012, Number 3 |
| Dates | Received 04 March 2012; revised manuscript received 14 April 2012; published online 30 October 2012 |
| Citation | Neelam Pahwa, A.D. Yadav, S.K. Dubey, et al., J. Nano- Electron. Phys. 4 No 3, 03003 (2012) |
| DOI | |
| PACS Number(s) | 1.05cf, 61.80Cb, 61.80Jh, 68.35bj, 68.35ct, 68.35Fx, 68.35Gy, 68.37Ps, 68.47Fg, 68.55ag, 68.55J - |
| Keywords | CdTe (15) , Thermal Evaporation (10) , Swift Heavy Ion Irradiation (3) , XRD (90) , AFM (18) , PSD. |
| Annotation |
Cadmium Telluride (CdTe) thin films grown by thermal evaporation on quartz substrates were irradiated with swift (100 MeV) Ni + 4 ions at various fluences in the range 1011 – 1013 cm – 2. The modification in structure and surface morphology has been analyzed as a function of fluence using XRD and AFM techniques. The XRD showed a reduction in peak intensity and grain size with increasing fluence. The AFM micrographs of irradiated thin films show small spherical nanostructures. In addition to direct imaging, AFM profile data enable to derive the Power Spectral Density (PSD) of the surface roughness. In the present work PSD spectra computed from AFM data were used for studying the surface morphology of films. The PSD curves were fitted with an appropriate analytic function and characteristic parameters were deduced and discussed in order to compare film morphology with varying fluence levels. |
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List of References |
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