Authors | Balbir Singh Patial1 , Nagesh Thakur2 , S.K. Tripathi3 |
Affiliations | 1 Department of Physics, Rajiv Gandhi Govt. College Chaura Maidan (Kotshera) Shimla, 171 004 H.P., India 2 Department of Physics, H.P. University Summer Hill Shimla, 171005 H.P., India 3 Center of Advanced Study in Physics, Panjab University Chandigarh, 160014, India |
Е-mail | bspatial@gmail.com, ntb668@yahoo.com, surya@pu.ac.in |
Issue | Volume 5, Year 2013, Number 2 |
Dates | Received 15 February 2013; revised manuscript received 28 April 2013; published online 04 May 2013 |
Citation | Balbir Singh Patial, Nagesh Thakur, S.K. Tripathi, J. Nano- Electron. Phys. 5 No 2, 02017 (2013) |
DOI | |
PACS Number(s) | 78.55.Qr, 81.70.Pg |
Keywords | Amorphous materials, DSC (2) , Crystallization activation energy, Avrami exponent. |
Annotation | The present study reports the assessment of activation energy for crystallization and crystallization reaction order (Avrami exponent n) for the amorphous-crystallization transformation process of Se85 − xTe15Inx (x 2, 6 and 10) amorphous alloys using differential scanning calorimetry (DSC) technique under non-isothermal conditions at four different heating rates (5, 10, 15 and 20 °C/min) through Gao and Wang model. The introduction of In to the Se-Te system is found to bring a change in crystallization mechanisms and dimensions of growth. |
List of References |